Particle Sensing Monitor AES-LPM (For Large Particles)

Shinyei Technology

Aerosol (Particle) Sensing

Particle Sensing MonitorAES-LPM (For Large Particles)

Particle Sensing Monitor AES-LPM(For Large Particles)

It can constantly monitor particles in painting process and various manufacturing processes where large particles of 5 to 50μm are disliked.
Useful for quality improvement and defect rate reduction at low cost.

  • Small size and low cost.

  • 4-level LED display for the number of large particles that fall without floating.

  • Detect particles of 5μm to 50μm* (*reference value).

  • 5 different outputs or communication interfaces.

  • Continuous monitoring and quick notification of abnormalities.

  • Temperature and humidity sensor avaliable as an option.

Application

For cleanliness management of semiconductor/precision parts manufacturing process.

For automatic air conditioning control in cleanrooms.
  • Problem

    Product quality and work efficiency are unstable.

  • Countermeasure

    Installation of AES-LPM for each manufacturing area helps to monitor the frequency of particle generation constantly.

  • Achievement

    Product quality and work efficiency is improved.

For improvement of product yield and loss cost reduction in painting line.

For automatic air conditioning control in cleanrooms.
  • Problem

    Painting defects on car body occur due to adhesion of contaminant particles.

  • Countermeasure

    Install AES-LPM to visualize the cleanliness level at painting line.

  • Achievement

    Appropriate cleanliness management reduces repainting works and loss cost.

For preventing troubles and accidents of power receiving and transforming equipment.

For electrical rooms or server rooms of the data center.
  • Problem

    Dielectric breakdown occurs due to dust adhering to insulation parts.

  • Countermeasure

    Install AES-LPM into the equipment to monitor dust concentration in real time.

  • Achievement

    It can prevent troubles and accidents of electrical equipment by replacing parts in advance.

For improvement of glass surface quality.

For alarm trigger when the filter of clean booth or clean bench is damaged.
  • Problem

    Product defects occur due to contaminant particles adhering to its surface.

  • Countermeasure

    Install AES-LPM at multiple places in facility to visualize the particle generated point.

  • Achievement

    Defect rate decreases by identifying the particle source.

For printing system control to keep its quality.

For improving manufacturing quality of semiconductors and precision parts.
  • Problem

    Contaminant particles adhesion occurs in mass production and causes a lot of damages.

  • Countermeasure

    Install AES-LPM to stop the printing machine once contaminant particle is detected.

  • Achievement

    Product defect is prevented and loss cost decreases.

Specification

Model AES-LPM
Optical Source Laser Diode
Detectable Particle Size 5μm/10μm/20μm/30μm/50μm (*1)
Measurement Range Class10,000 to Class100,000
Unit pcs/5 min (Default Condition), pcs/m3, pcs/cf, pcs/L
Output/Interface Alarm, Ethernet, Analog(1-5V), Wi-Fi, RS485
Measurement Time 300s
Data Update Time 1s
Power +24V
Power Consumption (max) +600mA
Operating Temperature 0℃ to +40℃
Storage Temperature -20℃ to +60℃
Operating Humidity 30%rh to 80%rh
Storage Humidity Below 90%rh (No condensation)
Weight Approx. 370g
Applicable Wire Size AWG26 to 20
  • (※1)10μm/20μm/30μm/50μm are reference information.